Multi-functional Diffractometer X Ray Diffraction XRD Analyzer

Product Specification

Multi-functional Diffractometer X Ray Diffraction XRD Analyzer

1.Product Introduction

The combined multi-functional X-ray diffractometer and high-resolution X-ray diffractometer are widely used in various fields of material structure analysis. The materials analyzed include: metallic materials, inorganic materials, composite materials, organic materials, nanomaterials, and superconducting materials. The material states that can be analyzed include: powder samples, block samples, film samples, and micro-area and trace samples. It is widely applied in research fields such as clay minerals, cement building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock minerals, and polymers.

2.Product Features 

The DX series diffractometer is designed for material research and industrial product analysis. It is a perfect product that combines routine analysis with special-purpose measurement.

• The perfect combination of hardware systems and software systems meets the needs of scholars and researchers in different application fields.
• High-precision diffraction Angle measurement system to obtain more accurate measurement results.
• The high-stability X-ray generator control system achieves more stable repeat measurement accuracy.
• A variety of functional accessories meet the needs of different testing purposes.
• Programmed operation and integrated structure design make it easy to operate and the instrument has a more aesthetically pleasing appearance.

X-ray diffractometer is a universal testing instrument for revealing the crystal structure and chemical information of materials.

• Identification of one or more phases in unknown samples.
• Quantitative analysis of known phases in mixed samples.
• Crystal structure analysis (Rietveld structure analysis).
• Crystal structure changes under unconventional conditions (high and low temperatures).
• Analysis of thin film samples, including the phase of the thin film, thickness of multilayer films, surface roughness, and charge density.
• Analysis of micro-area samples.
• Analysis of texture and stress of metallic materials.

The combination of perfect quality and outstanding performance

• In addition to its basic functions, the DX series diffractometer can be quickly equipped with various accessories and has an extremely strong analytical capability.
• High-precision mechanical processing greatly enhances the reproducibility of the accessory installation position. The software automatically recognizes the corresponding accessories without the need to calibrate the optical path. The accessory installation is plug-and-play, and simple operations can meet the needs of special-purpose measurements.

The perfect combination of high performance and practicality

• Based on the θ-θ geometric optical design, it is convenient for sample preparation and installation of various accessories.
• The application of metal ceramic X-ray tubes has greatly enhanced the operating power of diffractometers.
• Closed proportional counter, durable and maintenance-free.
• Silicon drift detectors feature superior angular resolution and energy resolution, and their measurement speed is increased by more than three times.
• A rich variety of diffractometer accessories are available to meet the needs of different analytical purposes.
• All functional accessories of the diffractometer are automatically recognized.
• The modular design, also known as plug-and-play components, enables operators to correctly use the corresponding accessories of the diffractometer without calibrating the optical system.

3.Product Functions

• Basic data processing functions (peak search, smoothing, background subtraction, peak shape fitting, peak shape magnification, spectrum comparison, Kα1, α2 stripping, diffraction line indexing, etc.).
• Rapid quantitative analysis without standard samples.
• Grain size measurement.
• Crystal structure analysis (measurement and refinement of unit cell parameters).

Macroscopic stress measurement and microscopic stress calculation;
Two-dimensional and three-dimensional display of multiple drawings;
Cluster analysis of diffraction peak patterns
Half-peak width correction curve of diffraction data;
Diffraction data Angle deviation correction curve;
Based on Rietveld's routine quantitative analysis;
Qualitative phase analysis is conducted using the ICDD database or user database;
Conduct quantitative analysis using the ICDD database or the ICSD database;

4.Product Parameter